A state of the art on ADC modelling-Reference-Cited by-同舟云学术

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A state of the art on ADC modelling

Published:2004-01 Issue:1 Volume:26 Page:31-42
ISSN:0920-5489
Container-title:Computer Standards & Interfaces
language:en
Short-container-title:Computer Standards & Interfaces

Author:

Arpaia P.,Daponte P.,Rapuano S.

Publisher

Elsevier BV

Subject

Law,Hardware and Architecture,Software

Reference96 articles.

1. Almost uniformity of quantization errors;Kushner;IEEE Trans. Instrum. Meas.,1991

2. Bias of mean value and mean square value measurements based on quantized data;Kollar;IEEE Trans. Instrum. Meas.,1994

3. Statistical theory of quantization;Widrow;IEEE Trans. Instrum. Meas.,1996

4. A noise model for quantized data;Bertocco;Proc. IEEE IMTC/98,1998

5. Code probability distributions of A/D converters with random input noise;Souders;IEEE Trans. Instrum. Meas.,1998

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Medium-precision ADC quantization error modeling for MIMO-OFDM;Digital Signal Processing;2021-10

2. A Universal Behavioral Model for COTS ADCs with Predictive Cold Temperature Performance Capability;2020 IEEE Aerospace Conference;2020-03

3. AD and DA conversion;Modern Measurements;2015-09-12

4. Error Models of the Analog to Digital Converters;Measurement Science Review;2014-04-01

5. Multisine With Optimal Phase-Plane Uniformity for ADC Testing;IEEE Transactions on Instrumentation and Measurement;2012-03

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