A TRIDYN study: Comparison of experimental SIMS useful yields with simulated Cs concentration evolution
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference40 articles.
1. Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry
2. Ultra shallow doping profiling with SIMS
3. Optimization of secondary ion mass spectrometry for quantitative trace analysis
4. Imaging of arsenic traces in human hair by nano-SIMS 50
5. Ion microprobe imaging of -labeled mammalian chromosomes
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope;Reports on Progress in Physics;2021-09-15
2. Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon;Semiconductors;2019-08
3. Effects of Metal and Nitrogen Combined Ion Implantation Treatment on Tribological Properties of Inconel 718;CHINA SURF ENG;2017
4. Industrial challenges in ion beam processing and metrology in the 3D era;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-12
5. High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy;Nanotechnology;2015-10-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3