Comprehensive modelling of secondary-ion energy spectra measured with a magnetic sector field instrument: II. Evaluation of experimental data
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference16 articles.
1. Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding
2. Matrix effects in the work-function dependence of negative-secondary-ion emission
3. Secondary ion yield variations due to cesium implantation in silicon
4. Electron work function decrease in SIMS analysis induced by neutral cesium deposition
5. On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Novel Model of Negative Secondary Ion Formation and Its Use To Refine the Electronegativity of Almost Fifty Elements;Analytical Chemistry;2014-05-27
2. Erratum to “Comprehensive modelling of secondary-ion energy spectra measured with a magnetic sector field instrument: II. Evaluation of experimental data” [Int. J. Mass Spectrom. 358 (2013) 49–58];International Journal of Mass Spectrometry;2014-02
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