Weak fault feature extraction for polycrystalline diamond compact bit based on ensemble empirical mode decomposition and adaptive stochastic resonance-Reference-Cited by-同舟云学术

Weak fault feature extraction for polycrystalline diamond compact bit based on ensemble empirical mode decomposition and adaptive stochastic resonance

Published:2021-06 Issue: Volume:178 Page:109304
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Gao Kangping,Xu Xinxin,Li Jiabo,Jiao Shengjie,Shi Ning

Funder

National Natural Science Foundation of China National Outstanding Youth Science Fund Project

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference41 articles.

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