Determination of the safe operating area in potentially destructive measurements using probability of feasibility
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Published:2024-09
Issue:
Volume:
Page:115649
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ISSN:0263-2241
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Container-title:Measurement
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language:en
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Short-container-title:Measurement
Author:
Barmuta Paweł,
Łukasik KonstantyORCID,
Ferranti Francesco,
Wiatr Wojciech,
Schreurs Dominique M.M.-P.
Funder
VUB
The Hercules Foundation
Vlaamse Overheid
Reference35 articles.
1. The Design and Analysis of Computer Experiments;Santner,2003
2. e-Handbook of Statistical Methods;NIST/SEMATECH,2012
3. D.E. Root, S. Fan, J. Meyer, Technology Independent Large Signal Non Quasi-Static FET Models by Direct Construction from Automatically Characterized Device Data, in: Europ. Microw. Conf., 2, 1991, pp. 927–932.
4. J. Xu, R. Jones, S. Harris, T. Nielsen, D. Root, Dynamic FET model - DynaFET - for GaN transistors from NVNA active source injection measurements, in: International Microwe Symposium, 2014, pp. 1–3.
5. Dynamic constraints for large-signal measurements on arbitrary grids;Barmuta;IEEE Trans. Microw. Theory Tech.,2016