Fast phase-shifting technique for 3-D surface micro-topography measurement
Author:
Publisher
Elsevier BV
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference24 articles.
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4. Single-shot parallel four-step phase shifting using on-axis Fizeau interferometry;Abdelsalam;Appl. Opt.,2012
5. Parallel two-step phase-shifting microscopic interferometry based on a cube beamsplitter;Gao;Opt. Comm.,2011
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