Toward a generic on chip conditioning system for strain gage sensors-Reference-Cited by-同舟云学术

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Toward a generic on chip conditioning system for strain gage sensors

Published:2006-05 Issue:4 Volume:39 Page:320-327
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Rabah Hassan,Poussier Sylvain,Weber Serge

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference12 articles.

1. An integrated software/hardware approach to experimental stress analysis;Howland,1986

2. Measurement of shock events by means of strain gauges and accelerometers;Knapp,1998

3. Available from: http://www.maxim-ic.com.

4. Available from: http://www.digikey.com/MKT/NewT022/Melexis/SpecializedICs.html.

5. Available from: http://www.vishay.com/brands/measurements_group/meters/inst.htm.

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