1. Recent development on DAC modelling testing and standardization;Balestrieri;Measurement,2006
2. International Technology Roadmap for Semiconductor, 2003 edition, http://www.public.itrs.net.
3. T.M. Souders, G.N. Stenbakken, A comprehensive approach for modeling and testing analog and mixed-signal devices, in: Proceedings of IEEE ITC 90, Washington, USA, September 1990, pp. 169–176.
4. P.P. Fasang, An optimal method for testing digital to analog converters, in: Proceedings of the 10th IEEE International ASIC Conference and Exhibit, Portland, USA, September1997, pp. 42–46.
5. A rigorous exposition of the LEMMA method for analog and mixed-signal testing;Wrixon;IEEE Transactions on Instrumentation and Measurement,1999