1. IEEE Std. 1241, IEEE Standard for terminology an test methods for analog-to-digital converters, IEEE, Piscataway, NJ, USA, 2000.
2. IEEE Std. 1057, IEEE Standard for digitizing waveform recorders, IEEE, Piscataway, NJ, USA, 2007.
3. Combined spectral and histogram analysis for fast ADC testing;Serra;IEEE Transactions on Instrumentation and Measurement,2005
4. DNL ADC testing by the exponential shaped voltage;Holcer;IEEE Transactions on Instrumentation and Measurement,2003
5. ADC parameters and characteristics;Rapuano;IEEE Instrumentation and Measurement Magazine,2005