Characterization system based on image mapping for field emission devices-Reference-Cited by-同舟云学术

Characterization system based on image mapping for field emission devices

Published:2016-11 Issue: Volume:93 Page:208-214
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Kopelvski Maycon M.,Galeazzo Elisabete,Peres Henrique E.M.,Ramirez-Fernandez Francisco J.,Silva Débora A.C.,Dantas Michel O.S.

Funder

Conselho Nacional de Desenvolvimento Tecnológico

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference18 articles.

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2. Vacuum micro-electronics;Zhu,2001

3. Field emission property of carbon nanotubes and their application to display devices;Saito,2011

4. Low-bremsstrahlung X-ray source using a low-voltage high-current-density nanostructured field emission cathode and a transmission anode for markerless soft tissue imaging;Cheng;J. Microelectromech. Syst.,2015

5. Silicon-based integrated field emission electron sources for sensor application;Schreiner,2011

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