Defining DAC performance in the frequency domain-Reference-Cited by-同舟云学术

Defining DAC performance in the frequency domain

Published:2007-06 Issue:5 Volume:40 Page:463-472
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Balestrieri E.,Rapuano S.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference51 articles.

1. IEEE Std. 1658 Draft, IEEE Standard for terminology and test methods for digital-to-analog converters, 2005.

2. E. Balestrieri, S. Moisa, S. Rapuano, DAC static parameter specifications – some critical notes, in: Proceedings of the 10th IMEKO TC4 Workshop on ADC Modelling and Testing, vol. I, Gdynia and Jurata, Poland, 12–15 September 2005, pp. 81–86.

3. E. Balestrieri, Some critical notes on DAC time domain specifications, in: Proceedings of the IEEE IMTC’06, Sorrento, Italy, 24–27 April 2006, pp. 930–935.

4. IEEE Std. 1241, IEEE Standard for terminology an test methods for analog-to-digital converters, 2000.

5. Analog–Digital Conversion Handbook;Analog Device,1986

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Modified Noise Model of Electrical Impedance Tomography System by Considering Colored Noises;IEEE Transactions on Instrumentation and Measurement;2022

2. Perceptual Evaluation of the Quantization Level of a Vibrotactile Signal;Haptic and Audio Interaction Design;2022

3. Nonlinear Quantization Technique for Multibit Sigma-Delta Modulators;2020 18th IEEE International New Circuits and Systems Conference (NEWCAS);2020-06

4. The Algorithm of Testing ADC Effective, Number of Bits Based on Hilbert and Wavelet Transform;Proceedings of the 2019 3rd International Conference on Information System and Data Mining - ICISDM 2019;2019

5. Improving Digital-to-Analog Converter Linearity by Large High-Frequency Dithering;IEEE Transactions on Circuits and Systems I: Regular Papers;2017-06