Funder
National Key Technology Support Program of China
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference21 articles.
1. Analysis and simulation of jitter sequences for testing serial data channels;Kim;IEEE Trans. Ind. Inf.,2008
2. Measuring the timing jitter of ATE in the frequency domain;Luca;IEEE Trans. Instrum. Meas.,2006
3. The instrument bandwidth effect in jitter and BER test for high-speed serial interconnection;Yang;IEEE Trans. Microwave Theory Tech.,2013
4. Nitin Radhakrishnan, Brice Achkir, Jun Fan, James L. Drewniak, Stressed jitter analysis for physical link characterization, in: Symp. IEEE Int. Symp. Electromagn. Compat., July 2010, pp. 568–572.
5. Jitter measurement and compensation for analog-to-digital converters;Fan;IEEE Trans. Instrum. Meas.,2009
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献