Optoelectronic phase delay measurement for a modified Michelson interferometer-Reference-Cited by-同舟云学术

Optoelectronic phase delay measurement for a modified Michelson interferometer

Published:2013-06 Issue:5 Volume:46 Page:1762-1765
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Bruns Thomas,Blume Frank,Baaske Kai,Bieler Mark,Volkers Henrik

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference3 articles.

1. ISO 16063-11:1999, Methods for the calibration of vibration and shock transducers – Part 11: Primary vibration calibration by laser interferometry, International Organization for Standardization, Geneva (1999).

2. Primary phase calibration of Laser-vibrometers with a single laser source;Blume;Metrologia,2009

3. Improved optoelectronic technique for the time-domain characterization of sampling oscilloscopes;Bieler;IEEE Trans. Instrum. Meas.,2009

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