Development of tool condition monitoring system in end milling process using wavelet features and Hoelder’s exponent with machine learning algorithms

Author:

Mohanraj T.,Yerchuru Jayanthi,Krishnan H.,Nithin Aravind R.S.,Yameni R.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference54 articles.

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