Author:
Wang Ruiyang,Li Dahai,Zhang Xinwei
Funder
National Natural Science Foundation of China
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference30 articles.
1. Contribution to analysis of the reflection grating method;Ritter;Opt. Lasers Eng.,1983
2. M. C. Knauer, J. Kaminski, G. Hausler, Phase measuring deflectometry: a new approach to measure specular free-form surfaces, Proc. SPIE 5457, (2004) 366–376.
3. T. Bothe, W. Li, C. V. Kopylow, W. Juptner, High-resolution 3D shape measurement on specular surfaces by fringe reflection, Proc. SPIE 5457, (2004) 411–422.
4. Software configurable optical test system: a computerized reverse Hartmann test;Su;Appl. Opt.,2010
5. G. Häusler, C. Faber, E. Olesch, S. Ettl, Deflectometry vs. interferometry, Proc. SPIE 8788, (2013) 87881C.
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献