Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference17 articles.
1. IEEE standard for terminology and test methods for analog-to-digital converters, IEEE Std, pp. 1241–2000.
2. Dynamic Characterization of Analog-to-Digital Converters;Dallet,2005
3. Sine fit versus discrete Fourier transform based algorithms in SNR testing of waveform digitizers;Bertocco;IEEE Transactions on Instrumentation and Measurement,1997
4. Dynamic testing of A/D converters by means of the three-parameter sine-fit algorithm;Belega;Measurement,2007
5. Interpolation algorithms for discrete Fourier transforms of weighted signals;Grandke;IEEE Transactions on Instrumentation and Measurement,1983
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献