Full-field measurement of residual stress in single-crystal diamond substrates based on Mueller matrix microscopy-Reference-Cited by-同舟云学术

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Full-field measurement of residual stress in single-crystal diamond substrates based on Mueller matrix microscopy

Published:2024-07 Issue: Volume:234 Page:114790
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Li Ziqing,Cui Changcai,Arteaga Oriol,Bian Subiao,Tong Han,Lu Jing,Xu Xipeng

Funder

Ministerio de Ciencia, Innovación y Universidades

Agencia Estatal de Investigación

European Regional Development Fund

National Natural Science Foundation of China

Publisher

Elsevier BV

Reference46 articles.

1. Chemical vapour deposition synthetic diamond: materials, technology and applications;Balmer;J Phys-Condens Mat,2009

2. Diamond semiconductor and elastic strain engineering;Dang;J. Semicond.,2022

3. A highly versatile X-ray and electron beam diamond dosimeter for radiation therapy and protection;Pettinato;Materials,2023

4. Design, realization, and characterization of a novel diamond detector prototype for FLASH radiotherapy dosimetry;Marinelli;Med. Phys,2022

5. Diamond device architectures for UV laser monitoring;Salvatori;Laser Phys.,2016

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