Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process-Reference-Cited by-同舟云学术

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Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Published:2023-01 Issue: Volume:206 Page:112222
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Vališ David,Forbelská Marie,Vintr Zdeněk,Tiep La Quoc,Leuchter Jan

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference38 articles.

1. MIL-HDBK-217F, Military Handbook: Reliability Prediction of Electronic Equipment, Washington: Department of Defence, 02-DEC-1991.

2. RIAC Automated Databook, Reliability Information Analysis Center, 2011 (https://www.quanterion.com/).

3. IESNA, IES Approved Method: Measuring Lumen Maintenance of LED Light Sources, IES Subcomm. Solid-State Light. IES Test. Proced. Commun., Standard IES LM-80-08, 2008, pp. 1-7.

4. Projecting Long Term Lumen Maintenance of LED Light Sources, document IESNA TM-21-11, 2011.

5. Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy;Do;IEEE Trans. Device Mater. Reliab.,2021

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