Optical microscopy with improved resolution using two-beam interference of low-coherence light-Reference-Cited by-同舟云学术

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Optical microscopy with improved resolution using two-beam interference of low-coherence light

Published:2016-01 Issue: Volume:78 Page:373-380
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Usuki Shin,Takada Tomohiro,Miura Kenjiro T.

Funder

JSPS KAKENHI

Mitsutoyo Association for Science and Technology

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference10 articles.

1. Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy;Gustafsson;J. Microsc.,2000

2. Nikon Super Resolution Fluorescent Microscope N-SIM, .

3. I5M: 3D widefield light microscopy with better than 100nm axial resolution;Gustafsson;J. Microsc.,1999

4. I5S: Wide-field light microscopy with 100-nm-scale resolution in three dimensions;Shao;Biophys. J.,2008

5. Advances in high-resolution imaging-techniques for three-dimensional imaging of cellular structures;Lidke;J. Cell Sci.,2012

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