Testing and evaluating one-dimensional latent ability-Reference-Cited by-同舟云学术

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Testing and evaluating one-dimensional latent ability

Published:2016-01 Issue: Volume:78 Page:348-357
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Turetsky Vladimir,Bashkansky Emil

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. Probabilistic Models for Some Intelligence and Attainment Tests;Rasch,1960

2. Introduction to Classical and Modern Test Theory;Crocker,2006

3. Best Test Design;Wright,1979

4. Rating Scale Analysis: Rasch Measurement;Wright,1982

5. A Rasch model for partial credit scoring;Masters;Psychometrika,1982

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