Simulation analysis of the influence of leakage resistance on 1–10–100 TΩ guarded resistance transfer devices accuracy

Author:

Kocjan BartłomiejORCID,Krawczyk Krystian,Lisowski MichalORCID

Funder

National Centre for Research and Development

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference20 articles.

1. A 1–100 build-up resistor for calibration of standard resistors;Hamon;J. Sci. Instrum.,1954

2. Errors in the series – parallel build-up of – four terminal resistors;Page;J. Res. NBS,1965

3. The accuracy of series and parallel connections of four terminal resistors;Riley;IEEE Trans. Instrum. Meas.,1967

4. Errors in the parallel connections of a 100:1 series – parallel build-up of fur – terminal resistors;Gorini;IEEE Trans. Instrum. Meas.,1972

5. Methods of Comparison of Standard Resistors with High Resistance Ratio;Skurzak,1973

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