Uncertainty evaluation in dithered ADC-based instruments-Reference-Cited by-同舟云学术

Uncertainty evaluation in dithered ADC-based instruments

Published:2008-05 Issue:4 Volume:41 Page:364-370
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Attivissimo Filippo,Giaquinto Nicola,Savino Mario

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference15 articles.

1. IEEE, Standard 1057-1994 for digitizing waveform recorders, December 1994.

2. IEEE, Standard 1241-2000 for terminology and test methods for analog-to-digital converters, December 2000.

3. ISO, Guide to the Expression of Uncertainty in Measurement (1st ed. 1993) 1995.

4. Draft Standard IEC 62008, Performance characteristics and calibration methods for digital data acquisition systems and relevant software, June 2002.

5. Approach to evacuate the virtual instrumentation measurement uncertainty;Nuccio;IEEE Trans. Instr. Meas.,2002

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