The periodic pulse photothermal radiometry technique within the front face configuration

Author:

Battaglia Jean-Luc,Ruffio Emmanuel,Kusiak Andrzej,Pradere Christophe,Abisset Emmanuelle,Chevalier Stéphane,Sommier Alain,Batsale Jean-Christophe

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference35 articles.

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2. Extending the 3ωmethod for thin-film analysis to high frequencies method for thin-film analysis to high frequencies;Raudzis;J. Appl. Phys.,2003

3. Analysis of heat flow in layered structures for time-domain thermoreflectance;Cahill;Rev. Sci. Instrum.,2004

4. T. Baba, K. Ishikawa, T. Yagi, N. Taketoshi, Measurements of Thermophysical Property of Thin Films by Light Pulse Heating Thermoreflectance Methods, arXiv e-prints (Sep 2007).

5. Optimized thermo-reflectance system for measuring the thermal properties of thin-films and their interfaces;Burzo,2006

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