Author:
Arvinth Davinci M.,Parthasarathi N.L.,Borah Utpal,Albert Shaju K.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference15 articles.
1. Measurement of surface roughness: comparison between a defect-of-focus optical technique and the classical stylus technique;Mignot;Wear,1983
2. Reliability of roughness measurements using contact stylus instruments with particular reference to results of recent research at the physikalischtechnische bundesanstalt;Hillmann;Wear,1984
3. Recent advances in separation of roughness, waviness and form Precision Engineering;Raja;Journal of the International Societies for Precision Engineering and Nanotechnology,2002
4. Influence of tip size on AFM roughness measurements;Sedin;Applied surface science,2001
5. Peter J. Blau, Rebecca L. Martin, Laura Reister, A comparison of several surface finish measurement methods as applied to ground ceramic and metal surfaces, ceramic technology report, Oak ridge national laboratory /m-4924.
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