Some statistical aspects of binary measuring systems

Author:

Emil Bashkansky,Tamar Gadrich

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference22 articles.

1. BIPM–JCGM 200:2012, International vocabulary of metrology—basic and general concepts and associated terms (VIM with minor corrections): 2.41.

2. BIPM–JCGM 100:2008, Evaluation of measurement data—Guide to the expression of uncertainty in measurement (GUM 1995 with minor corrections).

3. Some metrological aspects of ordinal measurements;Bashkansky;Accredit. Qual. Assur.,2010

4. Some metrological aspects of the comparison between two ordinal measuring systems;Bashkansky;Accredit. Qual. Assur.,2011

5. Interlaboratory comparison of measurement or test results of an ordinal property: analysis of variation;Bashkansky;Accredit. Qual. Assur.,2012

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