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Evaluation of fringe effect of electrical resistance tomography sensor

  • Published:2014-07 Issue: Volume:53 Page:145-160
  • ISSN:0263-2241
  • Container-title:Measurement
  • language:en
  • Short-container-title:Measurement

Author:

Sun Jiangtao,Yang Wuqiang

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference30 articles.

1. Agilent Technologies 2010, Agilent 34970A/34972A data acquisition/switch unit user’s guide, Second ed., Printed in Malaysia.

2. Three-dimensional nonlinear inversion of electrical capacitance tomography data using a complete sensor model;Banasiak;Progress Electromagnetics Res.,2010

3. Improving three-dimensional electrical capacitance tomography imaging using approximation error model theory;Banasiak;J. Electromagnetic Waves Appl.,2012

4. Direct image reconstruction for 3-D electrical resistance tomography by using the factorization method and electrodes on a single plane;Cao;IEEE Trans. Inst. Meas.,2013

5. Excitation patterns in three-dimensional electrical impedance tomography;Dehghani;Physiol. Meas.,2005

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