About the treatment of systematic effects in metrology-Reference-Cited by-同舟云学术

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About the treatment of systematic effects in metrology

Published:2009-12 Issue:10 Volume:42 Page:1459-1462
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Pavese Franco

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference22 articles.

1. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, Guide to the expression of uncertainty in measurement (GUM), second ed., ISO, Geneva, Switzerland, 1993.

2. DIN 1319, Fundamentals of metrology – Part I: basic terminology, Berlin, Beuth, 1995.

3. http://bipm.kcdb.org.

4. Theoria combinationis observationum erroribus minimis obnoxiae, Gottingen, (1823) English translation by Stewart;Gauss,1995

5. Probability in metrology;Rossi,2008

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1. Updated measurement method and uncertainty budget for direct emissivity measurements at the University of the Basque Country;Metrologia;2020-07-13

2. Empirical approaches to uncertainty analysis of X-ray computed tomography measurements: A review with examples;Precision Engineering;2020-07

3. A review of state-of-the-art 1D length scale calibration instruments;Measurement Science and Technology;2020-01-15

4. Not Normal: the uncertainties of scientific measurements;Royal Society Open Science;2017-01

5. Validation of measurements of land plot area using UAV imagery;International Journal of Applied Earth Observation and Geoinformation;2014-12

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