Author:
Wang Zhongyuan,Shang Yongheng,Liu Jiarui,Wu Xidong
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference14 articles.
1. Testing of precision DAC using low-resolution ADC with wobbling;Jin;IEEE Transactions on Instrumentation and Measurement,2008
2. M. D’Arco, A. Liccardo, M. Vadursi. Design of a test equipment for DAC’s performance assessment, in: Instrumentation and Measurement Technology Conference, 2009. I2MTC ‘09. IEEE, 5–7 May, 2009, pp. 1232–1237.
3. S. Kook, V. Natarajan, A. Chatterjee, S. Goyal, L. Jin, Testing of high resolution ADCs using lower resolution DACs via iterative transfer function estimation, In: Test Symposium, 2009 14th IEEE European, 25–29 May, 2009, pp. 3–8.
4. Simple, Fast and accurate eight points amplitude estimation method of sinusoidal signals for DSP based instrumentation;Vizireanu;Journal of Instrumentation,2012
5. Analytical formula for three points sinusoidal signals amplitude estimation errors;Vizireanu;International Journal of Electronics,2012
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