Shape analysis of current pulses delivered by semiconductor detectors: A new tool for fragmentation studies of high velocity atomic clusters and molecules-Reference-Cited by-同舟云学术

Shape analysis of current pulses delivered by semiconductor detectors: A new tool for fragmentation studies of high velocity atomic clusters and molecules

Published:2002-11 Issue:1-2 Volume:197 Page:155-164
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Chabot M.,Della Negra S.,Lavergne L.,Martinet G.,Wohrer-Béroff K.,Sellem R.,Daniel R.,Le Bris J.,Lalu G.,Gardès D.,Scarpaci J.A.,Désesquelle P.,Lima V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Plasma effects in semiconductor detectors

2. Plasma effects and charge collection time in solid state detectors

3. Charge collection in silicon detectors for strongly ionizing particles

4. The influence of plasma effects on the timing properties of surface-barrier detectors for heavy ions

5. Swift cluster-atom collisions: experiment and model calculations

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