Author:
Ozafrán M.J.,Debray M.E.,Eusebi R.,Kreiner A.J.,Vázquez M.E.,Burlón A.,Stoliar P.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
16 articles.
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1. Measurement of 12Cq+ and 35Clq+ ion induced X-ray production cross sections in V, Zr and Sn metal oxide films at 0.1 MeV/u - 1.0 MeV/u energies;Radiation Physics and Chemistry;2020-11
2. MicroPIXE analysis of removal of aqueous U(VI) by S. intermedia and P. stratiotes in the presence of Th(IV);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-08
3. Charge state effect on K-shell ionization of silicon induced by iodineq+ ions;The European Physical Journal D;2018-08
4. Cross sections of X-ray production induced on Ti, Fe, Zn, Nb and Ta by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-11
5. Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09