High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold: Appearance energies and Wannier exponents-Reference-Cited by-同舟云学术

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High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold: Appearance energies and Wannier exponents

Published:2003-05 Issue: Volume:205 Page:413-416
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Gstir B.,Denifl S.,Hanel G.,Rümmele M.,Fiegele T.,Stano M.,Feketeova L.,Matejcik S.,Becker K.,Scheier P.,Märk T.D.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Electron Impact Ionization;Märk,1985

2. Collisional Breakup in a Quantum System of Three Charged Particles

3. Comment on “Degenerate Wannier Theory for Multiple Ionization”

4. High-resolution electron ionization study of CO, (CO)2 and (CO)3: appearance energies and bond dissociation energies

5. Electron impact multiple ionization of neon, argon and xenon atoms close to threshold: appearance energies and Wannier exponents

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Secondary threshold laws for multiple ionization of atoms;Physical Review A;2004-12-23

2. Wannier-type threshold theory of multiple ionization;Journal of Physics B: Atomic, Molecular and Optical Physics;2004-11-23

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