A novel approach to angular-resolved X-ray photoelectron spectroscopy depth-profiling-Reference-Cited by-同舟云学术

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A novel approach to angular-resolved X-ray photoelectron spectroscopy depth-profiling

Published:2000-05 Issue: Volume:166-167 Page:350-356
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Stanchev A.,Ignatova V.,Ghelev Ch.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. V. Miteva, A. Stanchev, P. Stefanov, V. Slavova, K. Kostov, in: P. Misaelides (Ed.), Application of Particle and Laser Beams in Materials Technology, NATO ASI Series E: Applied Science, 283 (1994) 167

2. On the mechanism of bombardment-induced oxygen redistribution at ZrO2 surfaces

3. V. Miteva, in: Proceedings of 15th International Conference on the Application of Accelerators in Research and Industry, 4–7 November 1998, Denton, USA

4. Angular distribution of photoelectrons from a metal single crystal

5. Surface analysis and angular distributions in x-ray photoelectron spectroscopy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of a quadratic algorithm for the angular-resolved XPS method for depth profiling;Journal of Electron Spectroscopy and Related Phenomena;2002-02

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