Argon implantation into GaAs and in situ RBS analysis at 21 and 77 K-Reference-Cited by-同舟云学术

Argon implantation into GaAs and in situ RBS analysis at 21 and 77 K

Published:2000-03 Issue: Volume:161-163 Page:415-418
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Breeger B,Wendler E,Schubert Ch,Wesch W

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. G. Götz, K. Gärtner (Eds.), Ion Beam Analysis of Solids, Akademie-Verlag, Berlin, 1988

2. J.R. Tesmer, M. Nastasi (Eds.), Handbook of Modern Ion Beam Analysis, Materials Science Technology, Pittsburgh, 1995

3. B. Breeger, E. Wendler, W. Trippensee, Ch. Schubert, W. Wesch, to be published

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5. Two-beam irradiation chamber for in situ ion-implantation and RBS at temperatures from 15 K to 300 K;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-03