Charge states distribution of 0.16–3.3 MeV He ions transmitted through silicon-Reference-Cited by-同舟云学术

Charge states distribution of 0.16–3.3 MeV He ions transmitted through silicon

Published:2002-06 Issue:1-4 Volume:193 Page:66-70
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Bianconi M,Bentini G.G,Lotti R,Nipoti R

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. Charged Beam Interaction with Solids;Ohtsuki,1983

2. Dynamic Screening of Ions in Condensed Matter

3. CX. A study of charge exchange by helium ions in metals

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