In situ luminescence measurement of silica under soft X-ray and γ-ray irradiations

Author:

Yoshida Tomoko,Tanabe Tetsuo,Ii Tatsuya,Yoshida Hisao

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characterization of boroaluminosilicate glass surface structures by B K-edge NEXAFS;Journal of Non-Crystalline Solids;2011-10

2. X-ray excited 3.2 eV luminescence from amorphous silica: radiative electron relaxation through an unidentified centre and its thermal switching;Journal of Physics: Condensed Matter;2008-05-28

3. Thermoluminescence of silica-based materials irradiated by thermal neutrons;Journal of Physics D: Applied Physics;2008-02-25

4. Temperature dependence of luminescence from a silica glass under in-reactor irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-09

5. Observation of defect formation process in silica glasses under ion irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-09

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