Difference between bulk and thin film densities of metal oxide and fluoride films studied by NRA depth profiling techniques
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Nuclear Reaction Techniques in Materials Analysis
2. Ion beam handbook for material analysis, Part 4;Feldman,1977
3. A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O
4. The determination of the refractive index and thickness of a transparent film
5. A 3 MV tandetron facility at KFUPM
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Physicochemical, optical, and dielectric studies of physically vapor deposited amorphous thin Cu25-x (ZnGe)25-x Se50+2x films;Journal of Non-Crystalline Solids;2024-04
2. Investigation of tetrakis(ethylmethylamido)hafnium adsorption mechanism in initial growth of atomic layer deposited-HfO2 thin films on H-/OH-terminated Si (100) surfaces;Journal of Vacuum Science & Technology B;2023-09-28
3. Spectroscopic study of the effect of annealing temperature and atmosphere on the opto-electrical properties of sputtered ITO thin films;Bulletin of Materials Science;2023-04-11
4. Effect of annealing temperature in nitrogen atmosphere and under vacuum on structural, optical and electrical properties of sputtered ITO/Ni/ITO multilayer;Applied Physics A;2022-03-25
5. Nanocrystallization in FINEMET-Type Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 Thin Films;Materials;2020-01-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3