Author:
Kim Y.S.,Kim J.K.,Choi H.W.,Kim G.D.,Woo H.J.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Elastic Recoil Detection Analysis (ERDA);Surface and Thin Film Analysis;2011-04-12
2. Thin Film Characterisation Using MeV Ion Beams;Ion Beams in Nanoscience and Technology;2009
3. The development of a time of flight spectrometer for LARN;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05