Ion source brightness and nuclear microprobe applications
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference25 articles.
1. Applications of focused MeV ions to materials modification and analysis
2. A survey of recent PIXE applications in archaeometry and environmental sciences using the Oxford scanning proton microprobe facility
3. The new Heidelberg proton microprobe: The success of a minimal concept
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