Composition analysis of Co doped FeSix films by combining standard and heavy-ion RBS-Reference-Cited by-同舟云学术

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Composition analysis of Co doped FeSix films by combining standard and heavy-ion RBS

Published:1998-03 Issue: Volume:136-138 Page:273-277
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Bohne W.,Reinsperger G.-U.,Röhrich J.,Röschert G.,Selle B.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Electronic Properties of Semiconducting Silicides

2. A silicon/iron-disilicide light-emitting diode operating at a wavelength of 1.5 μm

3. Effects of Some Additives on Thermoelectric Properties of FeSi2Thin Films

4. Algorithms for the rapid simulation of Rutherford backscattering spectra

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrodeposition of Fe–Co Alloys into Nanoporous p-type Silicon: Influence of the Electrolyte Composition;Journal of Materials Research;2002-05

2. Comparative concentration analysis of Cr and Co in FeSi2 films performed by ERDA and RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03

3. Analysis of Co and Cr dopants in epitaxial films of β-FeSi 2 by ERDA, RBS, EDX and AES;Fresenius' Journal of Analytical Chemistry;1999-09-08

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