Author:
Ahmed M.,Garwan M.A.,Al-Ohali M.A.,Hamouz Z.,Soufi K.,Minqin R.,Rajta I.,Watt F.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference9 articles.
1. Proceedings of the IEEE 7th International Conference on Solid Dielectrics, Eindhoven, the Netherlands, 25–29 June 2001, p. 504
2. Micro-PIXE analysis of impurity distributions in “trees” grown in high-voltage cables
3. Impurities in semiconductive compounds used as HV cable shields
4. A. Belhadfa, A. Houdayer, P.F. Hinrichsen, G. Kajrys, in: IEEE Symposium on Electrical Insulation, Toronto, Canada, 3–6 June 1990