Surface defect formation on gypsum surfaces due to grazing incidence 78.2 MeV 127I ions: A comparative study employing tapping-mode scanning force microscopy and shadow-replica electron microscopy-Reference-Cited by-同舟云学术

Surface defect formation on gypsum surfaces due to grazing incidence 78.2 MeV 127I ions: A comparative study employing tapping-mode scanning force microscopy and shadow-replica electron microscopy

Published:1997-02 Issue:2 Volume:122 Page:255-261
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Kolesnikov D.A.,Reimann C.T.,Vorobyova I.V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference32 articles.

1. Scanning-force-microscopy study of MeV-atomic-ion-induced surface tracks in organic crystals

2. MeV-ion-induced defects in organic crystals

3. Radiation damage features on mica and L-valine probed by scanning force microscopy

4. Heavy-ion-induced sputtering and cratering of biomolecular surfaces

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of initial stage of chemical etching of ion tracks in polycarbonate;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-03

2. Comparative study of ion track profiles in amorphous SiO2 by TEM and AFM observations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-04

3. Surface Tracks and Cratering in Polymers;Fundamentals of Ion-Irradiated Polymers;2004

4. Track formation on LiF single crystal surface induced by high-energy Xe ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-11

5. Graphite irradiated by swift heavy ions under grazing incidence;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-06