Author:
Kelson I,Kaiser C.V,Levy Y,Biasiol G,Kapon E
Subject
Instrumentation,Nuclear and High Energy Physics
Reference7 articles.
1. Film thickness and composition monitoring during growth by molecular beam epitaxy using alpha particle energy loss
2. Y. Levy, A. Ballestad, M. Davies, Y. Feng, I. Kelson, W.J. Mandeville, V. Pacradouny, A. Schmalz, T. Tiedje, J.F. Young, MRS Proceedings, Spring, Berlin, 1999
3. Modern GaAs Processing Methods;Williams,1990
4. The Science and Engineering of Microelectronic Fabrication;Campbell,1996
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献