1. Specialist Periodical Reports of the Chemical Society;Robinson;Electrochemistry,1985
2. Proceedings of the Third International Conference on Ellipsometry,1976
3. Proceedings of the Fourth International Conference on Ellipsometry;Muller;Surf. Sci.,1980
4. Ellipsométrie '83, Int. Conf. on Ellipsometry and other Optical Techniques for Surface and Thin-film Analysis,1983
5. P.C. Hayfield, ref. 2, p. 488.