Critical analysis of electrical contacts to layered semiconductors for use in (photo)electrochemical studies-Reference-Cited by-同舟云学术

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Critical analysis of electrical contacts to layered semiconductors for use in (photo)electrochemical studies

Published:1989-09 Issue:2 Volume:269 Page:411-422
ISSN:0022-0728
Container-title:Journal of Electroanalytical Chemistry and Interfacial Electrochemistry
language:en
Short-container-title:Journal of Electroanalytical Chemistry and Interfacial Electrochemistry

Author:

Etman Mohamed,Neumann-Spallart Michael

Publisher

Elsevier BV

Subject

General Medicine,General Chemistry,General Medicine

Reference116 articles.

1. Metallurgical and electrical properties of alloyed Ni/AuGe films on n-type GaAs

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1. Role of Photogenerated Iodine on the Energy-Conversion Properties of MoSe2 Nanoflake Liquid Junction Photovoltaics;ACS Applied Materials & Interfaces;2018-07-18

2. Single-Nanoflake Photo-Electrochemistry Reveals Champion and Spectator Flakes in Exfoliated MoSe2 Films;The Journal of Physical Chemistry C;2018-03-06

3. Condensed phase diagrams for the metal–W–S systems and their relevance for contacts to WS2;Materials Science and Engineering: B;2016-10

4. Correlating Microstructure and Activity for Polysulfide Reduction and Oxidation at WS2Electrocatalysts;Journal of The Electrochemical Society;2013

5. Dependence of the electrochemical behavior of p-WSe2 single crystals on ohmic contacts;Journal of Materials Science Letters;1999

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