CdTe/ZnTe: Critical thickness and coherent heterostructures-Reference-Cited by-同舟云学术

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CdTe/ZnTe: Critical thickness and coherent heterostructures

Published:1991-01 Issue:2 Volume:9 Page:271-274
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Cibert J.,André R.,Deshayes C.,Feuillet G.,Jouneau P.H.,Dang Le Si,Mallard R.,Nahmani A.,Saminadayar K.,Tatarenko S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference12 articles.

1. Molecular beam epitaxial growth of a novel strained‐layer superlattice system: CdTe‐ZnTe

2. Resonance Raman scattering in CdTe‐ZnTe superlattices

3. Critical thickness in epitaxial CdTe/ZnTe

4. First Conference on Epitaxial Growth EPI 1;Tatarenko,1990

5. Relaxation of stresses in CdTe layers grown by molecular beam epitaxy

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