Far-infrared characterization of AlAsGaAs superlattice structure
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference10 articles.
1. Characterization of GaAsAlAs superlattices by laser-Raman spectroscopy
2. Far‐infrared analysis of alloy structure in HgTe–CdTe superlattices
3. Far‐infrared study of alloying in the HgTe‐CdTe superlattice
4. Infrared optical characterization of GaAsAlxGa1−xAs submicron heterostructures
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1. Influence of the buffer layer on the FIR reflectivity spectra of a thick superlattice;Superlattices and Microstructures;1997-03
2. Optical characterization in microelectronics manufacturing;Journal of Research of the National Institute of Standards and Technology;1994-09
3. IR spectroscopy of GaAs−GaP x As1−x superlattices;Journal of Applied Spectroscopy;1994-01
4. Characterization of GaAs/Ga1−xAlxAs multilayer systems by infrared spectroscopy at normal incidence;Solid State Communications;1993-09
5. Optical properties of semiconductor superlattices in the far infrared;Journal of the Optical Society of America A;1993-04-01
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