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High-energy auger and medium-energy backscattered electron diffraction as a probe of ultra-thin epitaxial overlayers, sandwiches and superlattices

  • Published:1987-01 Issue:5 Volume:3 Page:563-571
  • ISSN:0749-6036
  • Container-title:Superlattices and Microstructures
  • language:en
  • Short-container-title:Superlattices and Microstructures

Author:

Chambers S.A.,Vitomirov I.M.,Anderson S.B.,Chen H.W.,Wagener T.J.,Weaver J.H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Microstructural and atomic arrangement studies in Fe (110)/GaAs (110) heterostructures;Journal of Physics and Chemistry of Solids;2000-06

2. Structural and electrical properties of Fe films grown on InP substrates;Thin Solid Films;1999-01

3. EMISSION ELECTRON DIFFRACTION AND HOLOGRAPHY: A THEORETICAL SURVEY;Surface Review and Letters;1996-08

4. Epitaxial growth, structure, and composition of Fe films on GaAs(001)-2×4;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1996-07

5. Epitaxial growth of MgO on lattice-matched CrxMO1−x(001);Surface Science;1994-12
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