1. H. Tachimori, T. Sakon and T. Kaneko, 7th Keitusho Kohgaku Symp. of the Japanese Society of Applied Physics, ISAP Catalogue No. AP 902217, 1990.
2. Recognition of D defects in silicon single crystals by preferential etching and effect on gate oxide integrity
3. Characterization of swirl defects in floating-zone silicon crystals
4. Defect Control in Semiconductor Fabrication;Hasebe,1990
5. v. Ammon, A. Ehlert and W. Hensel, Proc. Satellite Symp. to ESSDERC 93, Grenoble, Vol. 93–15, The Electrochemical Society, 1993, p. 36.