1. ‘Designers content with an explosion in ASICs’;ANDREWS;Comp. Design,1988
2. ‘ASIC testing with high fault-coverage’;BUTZERIN;VLSI Syst. Design,1988
3. ‘Moving towards analog semicustom ICs’;CORLETT;Electron. Syst. Design Mag.,1988
4. ‘Timing analysis improves efficiency of ASIC design’;HARA;EDN,1988
5. ‘ASICs—service versus technology’;INGLIS;Electron. Eng.,1988