Sample preparation for hardware assurance
Author:
Publisher
Elsevier
Reference28 articles.
1. Quality control and authentication of packaged integrated circuits using enhanced-spatial-resolution terahertz time-domain spectroscopy and imaging;Ahi;Optics and Lasers in Engineering,2018
2. Analysis of dynamic laser injection and quiescent photon emissions on an embedded processor;Amin;Journal of Hardware and Systems Security,2020
3. FLIP-chip and “backside” techniques;Barton;Microelectronics and Reliability,1999
4. Contactless device characterization of transistor structures in silicon using electro optical frequency mapping (EOFM);Beyreuther;Microelectronics and Reliability,2020
5. Backside preparation & optics;Colvin,2019
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